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公开(公告)号:WO2023029667A1
公开(公告)日:2023-03-09
申请号:PCT/CN2022/099413
申请日:2022-06-17
Inventor: SHI, Liang , FANG, Wenlei , TANG, Linqun , ZHENG, Jianfei , WU, Jingzhang , GU, Qi , YUAN, Juntao , KIM, Evgenia , CHEN, Yongqin , BRITTAIN, George
Abstract: A detection system and a sample processing instrument for nanoparticles are provided. The detection system includes a light emitting unit and a light collection unit. The light emitting unit is configured to emit a light beam and project the light beam onto a nanoparticle to be detected. The light collection unit is configured to collect light beams from the nanoparticle so as to analyze the nanoparticles according to the collected light beams. The light emitting unit includes multiple light sources and a focusing lens, and the light beams emitted by the multiple light sources are focused through the focusing lens on a same detection position through which the nanoparticle is to pass.