公开(公告)号：WO2016150927A1

公开(公告)日：2016-09-29

申请号：PCT/EP2016/056181

申请日：2016-03-21

Applicant: FAZ TECHNOLOGY LTD.

Inventor： IBRAHIM, Selwan K. ,  O'DOWD, John ,  KARABACAK, Devrez Mehmet

IPC: G01D5/353

CPC classification number: G01M11/3181 ,  G01D5/35316 ,  G01D5/35387 ,  H01S5/06804 ,  H01S5/06821 ,  H01S5/0687

Abstract: The invention provides a measurement system to interrogate at least one birefringent optical sensor and a method to interrogate birefringent optical sensors at high speed and high resolution. The system and method detects, at least, a first and a second spectral feature that are polarization dependent, wherein the detected first and second spectral features correspond to different responses of at least one birefringent optical sensor.

Abstract translation: 本发明提供了一种用于询问至少一个双折射光学传感器的测量系统以及以高速和高分辨率询问双折射光学传感器的方法。 该系统和方法至少检测偏振相关的第一和第二光谱特征，其中检测到的第一和第二光谱特征对应于至少一个双折射光学传感器的不同响应。