DEBUG STATEMENT CATALOGS
    1.
    发明申请

    公开(公告)号:WO2022005447A1

    公开(公告)日:2022-01-06

    申请号:PCT/US2020/040093

    申请日:2020-06-29

    Abstract: An example system may include a processor and a non-transitory machine-readable storage medium storing instructions executable by the processor to generate a catalog; utilize the catalog to decode corresponding encoded tokenized debug statements; and utilize the catalog to prevent data associated with an encoded tokenized debug statement tagged with a first data characteristic designation tag from being decoded from an encoded trace.

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