公开(公告)号：WO2016056886A1

公开(公告)日：2016-04-14

申请号：PCT/MY2015/000082

申请日：2015-10-07

Applicant: MIMOS BERHAD ,  TENGKU AZHAR LONG SULAIMAN

Inventor： TENGKU AZHAR LONG SULAIMAN ,  MOHAMAD YUSRI BIN MOHAMAD YUSOF ,  ZHARFAN Hamdan

IPC: G01N21/64

CPC classification number: G01N21/6408

Abstract: The present invention relates to the sensing instruments and methods for measuring the phase measurement of an analyte more particularly, to a system and method for measuring a fluorescence emission signal with phase correction in phase fluorometric. One of the advantages of the present invention is that the system and method removes the effect of reflected excitation light source incident on the photodetector (216) and deriving accurate reference phase without using an optical filter or requiring matching excitation and reference/auxiliary light source modulation characteristics or matching light source driver electrical circuits. Another advantage of the system and method of the present invention is that it takes into account all components of system delays from light source drivers to the photodetector (216) output as compared to the conventional correction. Moreover, the system and method of the present invention is able to remove interfering component within the same frequency.

Abstract translation: 本发明涉及用于测量分析物的相位测量的感测仪器和方法，更具体地说，涉及一种通过荧光相位相位校正来测量荧光发射信号的系统和方法。 本发明的优点之一是系统和方法消除了入射到光电检测器（216）上的反射激发光源的影响，并且在不使用滤光器的情况下导出精确的参考相位，或者需要匹配的激励和参考/辅助光源调制 特性或匹配光源驱动电路。 本发明的系统和方法的另一个优点在于，与常规校正相比，其考虑了从光源驱动器到光电检测器（216）输出的系统延迟的所有分量。 此外，本发明的系统和方法能够去除相同频率内的干扰分量。