APPARATUS FOR CUTTING SPECIMENS FOR MICROSCOPIC EXAMINATION

    公开(公告)号:WO2019156884A2

    公开(公告)日:2019-08-15

    申请号:PCT/US2019/016029

    申请日:2019-01-31

    Abstract: Cutting apparatuses comprising: a base; a first platen and a second platen that are coupled to the base and that are configured to hold a specimen, wherein the first platen includes a first cutting surface and the second platen includes a second cutting surface; a moveable carriage that is moveably coupled to the base; a cutting arm that is pivotably coupled at a pivot point to the carriage and that is configured to hold a cutting blade; and a spring coupled to the arm so as to apply a directional force to the arm and the blade, wherein the moveable carriage can be moved in a manner that causes the blade to slide on at least one of the first cutting surface and the second cutting surface while being pressed against the at least one of the first cutting surface and the second cutting surface by the directional force.

    APPARATUS FOR CUTTING SPECIMENS FOR MICROSCOPIC EXAMINATION

    公开(公告)号:WO2019156884A3

    公开(公告)日:2019-08-15

    申请号:PCT/US2019/016029

    申请日:2019-01-31

    Abstract: Cutting apparatuses comprising: a base; a first platen and a second platen that are coupled to the base and that are configured to hold a specimen, wherein the first platen includes a first cutting surface and the second platen includes a second cutting surface; a moveable carriage that is moveably coupled to the base; a cutting arm that is pivotably coupled at a pivot point to the carriage and that is configured to hold a cutting blade; and a spring coupled to the arm so as to apply a directional force to the arm and the blade, wherein the moveable carriage can be moved in a manner that causes the blade to slide on at least one of the first cutting surface and the second cutting surface while being pressed against the at least one of the first cutting surface and the second cutting surface by the directional force.

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