X-RAY EXAMINATION APPARATUS COMPRISING A FILTER
    1.
    发明申请
    X-RAY EXAMINATION APPARATUS COMPRISING A FILTER 审中-公开
    包含过滤器的X射线检查装置

    公开(公告)号:WO1996000967A1

    公开(公告)日:1996-01-11

    申请号:PCT/IB1995000486

    申请日:1995-06-15

    CPC classification number: G21K1/10 H05G1/60

    Abstract: An X-ray examination apparatus according to the invention comprises a filter for limiting the dynamic range of an X-ray image formed on an X-ray detector by irradiation of an object, for example a patient to be examined, by means of X-rays. The filter comprises a number of electrodes and grains or powder particles containing an X-ray absorbing material and suspended in a suspension liquid. When a voltage is applied to electrodes, X-ray absorbing material in the suspension will move to the excited electrodes under the influence of electrophoresis. A distribution with a desired X-ray absorption profile is adjusted by application of a suitable voltage pattern. The electrodes may have dimensions of, for example 0.5 x 0.5 mm, enabling an X-ray absorption profile to be obtained with a high spatial resolution. The X-ray absorption profile can be changed within a brief period of time, for example within one second, by changing the voltage pattern on the electrodes.

    Abstract translation: 根据本发明的X射线检查装置包括:滤光器,用于通过X射线检测器的X射线图像的X射线图像的X射线照射, 射线。 过滤器包括多个电极和含有X射线吸收材料并悬浮在悬浮液中的颗粒或粉末颗粒。 当对电极施加电压时,悬浮液中的X射线吸收材料将在电泳的影响下移动到激发电极。 通过施加合适的电压模式来调整具有期望的X射线吸收曲线的分布。 电极可以具有例如0.5×0.5mm的尺寸,使得能够以高空间分辨率获得X射线吸收曲线。 可以通过改变电极上的电压图案,在短时间内,例如在一秒内改变X射线吸收曲线。

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