摘要:
A resistive focusing lens structure for an electron beam device wherein the total resistance of the focusing lens structure is larger than 2.5 G OMEGA and the absolute value of the temperature coefficient of resistance is smaller than 250.10 K . Preferably, said resistive focusing lens structure comprises a resistance layer of a fired suspension of a conductive material of a mixture of a lead ruthenate, a lead titanate and a ruthenium oxide in a glass formed of silicon dioxide, aluminum oxide and lead oxide.