公开(公告)号：WO2020106197A1

公开(公告)日：2020-05-28

申请号：PCT/SE2019/051010

申请日：2019-10-14

Applicant: PRISMATIC SENSORS AB

Inventor： DANIELSSON, Mats ,  SUNDBERG, Christel

IPC: G01T1/24 ,  A61B6/03 ,  G01N23/04 ,  G01T1/29

Abstract: There is provided an x-ray imaging system (100) comprising an x-ray source (10), and an associated x-ray detector (20), wherein the x-ray detector (20) is a photon counting x-ray detector for enabling detection of photon-counting events. The x-ray imaging system (100) is configured for enabling acquisition of at least one phase contrast image based on detected photon-counting events. The x-ray detector (20) is based on a number of x-ray detector sub-modules, also referred to as wafers, each of which comprises detector elements, wherein the x-ray detector sub-modules are oriented in edge-on geometry with their edge directed towards the x-ray source, assuming the x- rays enter through the edge. Each x-ray detector sub-module or wafer has a thickness with two opposite sides of different potentials to enable charge drift towards the side, where the detector elements, also referred to as pixels, are arranged. The x-ray imaging system (100) is further configured to determine an estimate or measure of charge diffusion originating from a Compton interaction or an interaction through photoeffect related to an incident x-ray photon in an x-ray detector sub-module or wafer of the x-ray detector, and to determine an estimate of a point of interaction of the incident x-ray photon in the x-ray detector sub-module based on the determined estimate or measure of charge diffusion.

公开(公告)号：WO2022037763A1

公开(公告)日：2022-02-24

申请号：PCT/EP2020/073116

申请日：2020-08-18

Applicant: PRISMATIC SENSORS AB

Inventor： SUNDBERG, Christel ,  BERGENTOFT, Filip ,  PERSSON, Mats ,  DANIELSSON, Mats

IPC: G01T1/172 ,  G01T1/24 ,  G01T1/29 ,  G01V5/00

Abstract: There is provided an x-ray detector system (5) comprising a photon-counting x-ray detector (20) for detecting x-ray radiation from an x-ray source, and a coincidence detection system (60) configured to determine and/or obtain information about the radiation incident on the x-ray detector based on information about the time of photon interactions in said x-ray detector and information about the location of the x-ray source in relation to the x-ray detector. There is also provide an x-ray imaging system comprising such an x-ray detector system, as well as a corresponding coincidence detection system and a corresponding method.