公开(公告)号：WO2013150291A1

公开(公告)日：2013-10-10

申请号：PCT/GB2013/050864

申请日：2013-04-02

Applicant: RENISHAW PLC

Inventor： THURSTON, Thomas ,  BELL, Ian ,  SMITH, Brian ,  WOOLFREY, Andrew ,  GREEN, Julie

IPC: G01N21/65 ,  G01N33/53

CPC classification number: G01M11/00 ,  G01J3/44 ,  G01N21/65 ,  Y10T29/49764

Abstract: A method of measuring the performance of a spectroscopy system comprising obtaining a plurality of component spectra for each component of a set of components that are to be identified by the system, the component spectra obtained for variations of at least one factor that affects the component spectrum. Sample spectra and then simulated, each sample spectrum simulated for a corresponding potential sample using at least one different component spectrum and/or a different amount of at least one of the component spectra to that used to simulate the other sample spectra. The sample spectra are analysed to obtain, for each sample spectrum, a measured quantity and/or quality for a characteristic of the corresponding potential sample and a measure of performance generated based upon the measured quantities and/or qualities. The invention also concerns apparatus for carrying out this method.

Abstract translation: 一种测量光谱系统的性能的方法，包括获得由系统识别的一组分量的每个组分的多个分量光谱，所述分量光谱被获得用于影响分量光谱的至少一个因素的变化 。 样品光谱然后模拟，使用至少一种不同分量光谱和/或不同量的至少一种分量光谱与用于模拟其他样品光谱的相应电位样品模拟每个样品光谱。 分析样品光谱，为每个样品光谱获得相应潜在样品的特征的测量量和/或质量，以及基于测量的量和/或质量产生的性能测量。 本发明还涉及用于实施该方法的装置