公开(公告)号：WO2023008727A1

公开(公告)日：2023-02-02

申请号：PCT/KR2022/008002

申请日：2022-06-07

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： GOEL, Prash ,  AGGARWAL, Kunal ,  GUPTA, Gaurav ,  MONDAL, Arindam ,  MATHUR, Aniroop ,  TEKRIWAL, Archit

IPC: H04M1/72454 ,  G01P15/08

Abstract: Embodiments disclosed herein relate to electronic devices, and more particularly to estimating a damage risk level for an electronic device. A method disclosed herein includes measuring motion parameters of the electronic device, on the electronic device being dropped on a surface. The method further includes classifying the surface into at least one type by processing the measured motion parameters using a classifier module. The method further includes estimating a damage risk score depicting the damage risk level for the electronic device based on the classified surface, the measured motion parameters of the electronic device, and a usage history of the electronic device.