FAULT DETECTION IN DUAL MICROPROCESSOR ELECTRONIC TRIP UNIT
    1.
    发明申请
    FAULT DETECTION IN DUAL MICROPROCESSOR ELECTRONIC TRIP UNIT 审中-公开
    双微电脑电子走线单元故障检测

    公开(公告)号:WO2015047123A1

    公开(公告)日:2015-04-02

    申请号:PCT/RU2013/000836

    申请日:2013-09-25

    Abstract: The invention relates to a fault detection method and system in an Electronic Trip Unit (ETU). An ETU includes a Protection Function (PF) and a Metering Function (MF), each of the PF and MF measuring in parallel the same one or more power line parameters. A comparator compares the first measurement and the second measurement and outputs a fault signal when a disagreement is detected with a given level of accuracy between the first measurement and the second measurement. At least one further comparator may be used that compares the first measurement and the second measurement, and a voter circuit that collects signals resulting from each said comparing and detects a fault when at least one fault signal exists among said collected signals.

    Abstract translation: 本发明涉及电子跳闸单元(ETU)中的故障检测方法和系统。 ETU包括保护功能(PF)和计量功能(MF),每个PF和MF并联测量相同的一个或多个电源线参数。 比较器比较第一测量和第二测量,并且当在第一测量和第二测量之间以给定的准确度检测到不一致时,输出故障信号。 可以使用比较第一测量和第二测量的至少一个另外的比较器,以及选择电路,其收集由每个所述比较产生的信号,并且在所述收集的信号中存在至少一个故障信号时检测故障。

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