SILICON-BASED MASS AIRFLOW SENSOR
    1.
    发明申请
    SILICON-BASED MASS AIRFLOW SENSOR 审中-公开
    基于硅的大气压传感器

    公开(公告)号:WO1989005963A1

    公开(公告)日:1989-06-29

    申请号:PCT/US1988004511

    申请日:1988-12-16

    CPC classification number: G01L9/0048 G01F1/6845

    Abstract: A mass airflow sensor is fabricated on a semiconductor substrate (18) and includes a dielectric diaphragm (1), p-etch-stopped silicon rim (2), thin-film heating (3) and temperature sensing elements (4-7), and tapered chip edges (18). The dielectric diaphragm (1) is formed with thin silicon oxide and silicon nitride in a sandwich structure (32) and provides excellent thermal insulation for the sensing (4-7) and heating (3) elements of the sensor. The diaphragm (1) dimensions, including thickness, are accurately controlled through the use of the heavily-p-doped silicon rim (2) to help ensure uniform and reproducible sensor performance.

    SILICON-BASED SENSORS AND METHOD OF MAKING SAME
    2.
    发明申请
    SILICON-BASED SENSORS AND METHOD OF MAKING SAME 审中-公开
    基于硅的传感器及其制造方法

    公开(公告)号:WO1989005968A1

    公开(公告)日:1989-06-29

    申请号:PCT/US1988004510

    申请日:1988-12-16

    CPC classification number: G01F1/6845 Y10T29/49082 Y10T29/4913

    Abstract: A silicon-based sensor (10) includes a substrate (20), a sensor element (12), and a protective diaphragm (22a) mounting and covering the sensor element (12). The diaphragm (22a) is a silicon layer (22) which, in a preferred embodiment, includes an etch-stop dopant. The etch-stop layer (22) is sealed to the substrate (20) so that the layer (22) covers and mounts the sensor element (12) to the substrate (20). The sensor (10) is fabricated by forming a trough area (33) in a surface (32) of a silicon block (30) (e.g., a silicon chip or wafer), treating the trough area (33) with an etch-stop dopant (e.g., boron), depositing a sensor element (12) onto the doped trough area (33), sealing at least the periphery of the doped trough area (33) to a surface of a substrate (20) (e.g., glass) so as to encapsulate the sensor element (12), and then etching away undoped regions of the silicon block (30) so that the doped trough area (33) remains as a protective diaphragm (22a) sealed to the substrate (20) and covering the sensor element (12). It is also possible to form a bonding pad (16) on untreated (e.g., undoped) discontinuous regions (22c) of an otherwise etch-stop treated trough layer (34) so that when etched, the bonding pad (16) is exposed to permit interconnection with electronic circuitry, yet the etch-stop treated layer (22) remains so as to mount the bonding pad (16) to the substrate.

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