公开(公告)号：WO2013043786A2

公开(公告)日：2013-03-28

申请号：PCT/US2012/056203

申请日：2012-09-20

Applicant: TERADYNE, INC.

Inventor： MERROW, Brian S. ,  TOSCANO, John P. ,  DUTREMBLE, Tom ,  TRUEBENBACH, Eric L.

IPC: G01R31/00

CPC classification number: G11B33/128

Abstract: A storage device test system includes a test slot configured to receive at least two storage devices for testing, the at least two storage devices being in a same plane.

Abstract translation: 存储设备测试系统包括被配置为接收至少两个用于测试的存储设备的测试槽，所述至少两个存储设备在同一平面中。