A SYSTEM AND METHOD FOR MEASURING THE INTERFACE TENSILE STRENGTH OF PLANAR INTERFACES
    1.
    发明申请
    A SYSTEM AND METHOD FOR MEASURING THE INTERFACE TENSILE STRENGTH OF PLANAR INTERFACES 审中-公开
    用于测量平面界面的界面拉伸强度的系统和方法

    公开(公告)号:WO1994020829A1

    公开(公告)日:1994-09-15

    申请号:PCT/US1994002268

    申请日:1994-03-02

    CPC classification number: G01L1/241

    Abstract: A system for measuring the tensile strength of a planar interface between a substrate (30) and a coating (32) which includes an energy source (20) that generates an electromagnetic beam (24) along a first axis, and a sample assembly disposed along the first axis having a first face, and a second face, where the first and second faces are oppositely opposed. The sample assembly includes a confining plate (26), an energy absorbing layer (28), a substrate (30) and a coating (32) having a free surface, all in intimate facing contact with each other, and where the sample (30) and a coating (32) having a free surface, all in intimate facing contact which each other, and where the sample (30) and the coating (32) are in intimate facing contact forms a substrate/coating interface. The coating (32) is positioned along the first axis so that the coating (32) free surface forms the sample assembly second face and the confining plate (26) forms the sample assembly first face.

    Abstract translation: 一种用于测量衬底(30)和涂层(32)之间的平面界面的拉伸强度的系统,其包括沿着第一轴线产生电磁束(24)的能量源(20)和沿着第一轴线生成的样品组件 所述第一轴具有第一面和第二面,其中所述第一面和所述第二面相对地相对。 样品组件包括限制板(26),能量吸收层(28),基底(30)和具有自由表面的涂层(32),所有这些都具有彼此紧密的接触,并且其中样品(30 )和具有彼此紧密接触的自由表面的涂层(32),并且样品(30)和涂层(32)紧密接触的接触形成基底/涂层界面。 涂层(32)沿着第一轴线定位,使得涂层(32)游离表面形成样品组件第二面,并且限制板(26)形成样品组件第一面。

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