公开(公告)号：WO2018085015A1

公开(公告)日：2018-05-11

申请号：PCT/US2017/056175

申请日：2017-10-11

Applicant: XCERRA CORPORATION

Inventor： MAGNUSON, Aaron ,  YAKUSHEV, Sergey ,  TREIBERGS, Valts ,  SIKORSKI, Dan

IPC: H01R12/71 ,  G01R1/04 ,  H01R4/48 ,  H01R12/00 ,  H01R13/00 ,  H01R13/11

CPC classification number: G01R1/0433

Abstract: A test socket with a link and mount system is used to couple a device under test to a testing apparatus for quick and reliable testing of microchips post-production. The socket includes a pivoting link that connects to the DUT, an elastomer for biasing the link in a first preferred orientation, and a mount that operates as a fulcrum to rotate the link into engagement with the DUT. The mount includes projections that extend below a bottom surface of the socket, such that engagement of the mount with the test device at the projections translates the mount parallel to a diagonal support wall in the socket such that the mount is driven away from the bottom surface of the socket and also toward the elastomer. The socket includes a gap above the mount to allow for movement of the mount within the socket, eliminating the fixed arrangement and the non-compliant loads that accompany the engagement of the mount to the test apparatus. The mount projections carry a small preload that ensures successful contact with the test equipment without the risk of damaging the test equipment with rigid contact surfaces.

Abstract translation: 带有连接和安装系统的测试插座用于将被测器件耦合到测试仪器，以便快速和可靠地测试微芯片后期制作。 插座包括连接到DUT的枢转连杆，用于以第一优选方位偏置连杆的弹性体，以及作为支点旋转连杆以与DUT接合的支架。 所述安装件包括在所述插座的底表面下方延伸的突起，使得所述安装件与所述测试装置在所述突起处的接合将所述安装件平行于所述插座中的对角支撑壁平移，使得所述安装件被驱动离开所述底表面 的插座，也朝向弹性体。 插座在安装座上方包括间隙以允许安装座在插座内移动，从而消除了固定装置和伴随着安装座接合到测试设备的不顺应负载。 安装凸起带有小的预紧力，可确保与测试设备的成功接触，而不会有刚性接触表面损坏测试设备的风险。