Abstract:
A technique for reducing leakage current in static CMOS devices by adding additional transistors in series between selected inverters and ground or power. NMOS and PMOS transistors are added to selected buffers comprised of two inverters in series. The PMOS transistor (124) is connected between the first inverter (112,114) and power (Vdd) and the NMOS transistor (126) is connected between the second inverter (128) and ground. The added transistors are controlled by a memory cell (130) to be on when the buffer is being used and off when the buffer is unused. Alternatively, no PMOS transistor is added and an existing PMOS transistor of the first inverter is manufactured to sit in a Vgg well. The same tech niques are employed with selected buffer pairs.
Abstract:
An example integrated circuit (IC) system includes a package substrate (202) having a programmable integrated circuit (IC) (101 A) and a companion IC (103A) mounted thereon, the programmable IC including a programmable fabric (404) and the companion IC including application circuitry (107A). The IC system further includes a system-in-package (SiP) bridge (144) including a first SiP IO circuit (140A) disposed in the programmable IC, a second SiP IO circuit (142) disposed in the companion IC, and conductive interconnect (138) on the package substrate electrically coupling the first SiP IO circuit and the second SiP IO circuit. The IC System further includes first aggregation and first dispersal circuits (110, 112) in the programmable IC coupled between the programmable fabric and the first SiP IO circuit. The IC system further includes second aggregation and second dispersal circuits (126, 128) in the companion IC coupled between the application circuitry and the second SiP IO circuit.
Abstract:
Disclosed approaches for processing a circuit design include identifying (604) duplicate instances (104, 106) of modules in a representation of the circuit design. A processor circuit (702) performs folding operations (610) for at least one pair of the duplicate instances of a module. One instance of the duplicates is removed (612) from the circuit design, and a multiplexer (210) is inserted (614). The multiplexer receives and selects one of the input signals to the duplicate instances and provides the selected input signal to the remaining instance. For each flip-flop (1 16) in the remaining instance, a pipelined flip-flop (204) is inserted (616, 618). Connections to a first clock signal in the remaining instance are replaced (624) with connections to a second clock signal having twice the frequency of the first clock signal. An alignment circuit (216) is inserted (626) to receive the output signal from the first instance and provide concurrent first and second output signals.
Abstract:
An example integrated circuit (IC) system includes a package substrate (202) having a programmable integrated circuit (IC) (101 A) and a companion IC (103A) mounted thereon, the programmable IC including a programmable fabric (404) and the companion IC including application circuitry (107A). The IC system further includes a system-in-package (SiP) bridge (144) including a first SiP IO circuit (140A) disposed in the programmable IC, a second SiP IO circuit (142) disposed in the companion IC, and conductive interconnect (138) on the package substrate electrically coupling the first SiP IO circuit and the second SiP IO circuit. The IC System further includes first aggregation and first dispersal circuits (110, 112) in the programmable IC coupled between the programmable fabric and the first SiP IO circuit. The IC system further includes second aggregation and second dispersal circuits (126, 128) in the companion IC coupled between the application circuitry and the second SiP IO circuit.
Abstract:
An example integrated circuit (IC) system includes a package substrate (202) having a programmable integrated circuit (IC) (101 A) and a companion IC (103A) mounted thereon, the programmable IC including a programmable fabric (404) and the companion IC including application circuitry (107A). The IC system further includes a system-in-package (SiP) bridge (144) including a first SiP IO circuit (140A) disposed in the programmable IC, a second SiP IO circuit (142) disposed in the companion IC, and conductive interconnect (138) on the package substrate electrically coupling the first SiP IO circuit and the second SiP IO circuit. The IC System further includes first aggregation and first dispersal circuits (110, 112) in the programmable IC coupled between the programmable fabric and the first SiP IO circuit. The IC system further includes second aggregation and second dispersal circuits (126, 128) in the companion IC coupled between the application circuitry and the second SiP IO circuit.