Abstract:
본 발명은 용융 실리콘에서 잉곳을 성장시키기 위한 종자 결정을 수용하는 시드 척에 있어서, 용융 실리콘의 상측으로 열이 방출되는 것을 차단하는 넥 커버; 및 넥 커버의 바닥면에 배치되고, 종자 결정을 수용하는 고정부를 포함하고, 넥 커버는 승강 케이블이 연결되는 상면과, 바닥면과, 상면과 바닥면을 연결하는 둘레면을 포함하고, 둘레면은 바닥면과 경사각을 가지며 형성되며, 넥 커버에는 용융 실리콘의 측정을 위한 측정부가 개구되어, 멜팅 공정시 넥 커버가 어퍼 단열체의 홀에 위치되는 것에 의해 어퍼 단열체의 홀을 통한 열손실을 최소화할 수 있고, 넥 커버가 용융 실리콘의 온도 측정을 방해하지 않는 것에 의해 용융 실리콘의 온도 측정을 도울 수 있고, 용융 실리콘 온도 감지의 신뢰성을 높일 수 있는 이점이 있다.
Abstract:
An production apparatus (10) is used for a solution growth method. The production apparatus (10) includes a seed shaft (28) and a crucible (14). The seed shaft (28) has a lower end surface to which an SiC seed crystal (32) is attached. The crucible (14) contains an SiC solution (15). The crucible (14) includes a cylindrical portion (34), a bottom portion (36), and an inner lid (38). The bottom portion (36) is disposed at a lower end of the cylindrical portion (34). The inner lid (38) is disposed in the cylindrical portion (34). The inner lid (38) has a through hole (40) and is positioned below a liquid surface of the SiC solution (15) when the SiC solution (15) is contained in the crucible (14).
Abstract:
Provided is an ingot growing apparatus, which includes a crucible containing a silicon melt, a pulling device pulling a silicon single crystal ingot grown from the silicon melt, and a dopant supply unit disposed adjacent to the pulling device and for supplying a dopant during growing of the ingot. The neck portion may be doped at a concentration higher than that of the ingot through the dopant supply unit. Therefore, dislocation propagation velocity may be decreased and a propagation length may be shortened.
Abstract:
A chuck assembly which is electrically conductive for detecting initial contact between a semiconductor seed crystal and a molten semiconductor source material for growing an ingot according to the Czochralski process. The chuck assembly holds the seed crystal and suspends the seed crystal from an elongate member. The chuck assembly includes an upper chuck body in electrical continuity with the elongate member and a lower chuck body in electrical continuity with the seed crystal. An electrically conductive element extends between conductive portions of the upper and lower chuck bodies for providing electrical continuity between the seed crystal and the elongate member to enable flow of electrical current when the seed crystal touches the melt. The conductive element is preferably a coil spring which resiliently adjusts to variations in spacing between the upper and lower chuck bodies.
Abstract:
In a conventional method of pulling a large-sized single crystal, an expanded portion and a contracted portion are formed on the lower side of a neck, and the contracted portion is engaged with the single crystal, which is then pulled. During the formation of the contracted portion, the diameter thereof is reduced sharply in a usual case. Even when the diameter of this portion is controlled by using an optical measuring means, a fusion ring on the contracted portion which is hidden behind the expanded portion cannot be observed, so that it is difficult to control the diameter of the crystal. A single crystal pulling apparatus used in this method has a complicated structure and is liable to get out of order at high temperature. According to the present invention, a contracted portion is formed under the condition where the diameter thereof can be measured constantly with an optical measuring means. This method uses a single crystal pulling apparatus which is provided with a pressing means which constitutes a single crystal retaining means, and which is adapted to move a locking portion engaged with a contracted portion of the crystal from a standby position to a contracted portion engaging position.
Abstract:
Provided is an ingot growing apparatus, which includes a crucible containing a silicon melt, a pulling device pulling a silicon single crystal ingot grown from the silicon melt, and a dopant supply unit disposed adjacent to the pulling device and for supplying a dopant during growing of the ingot. The neck portion may be doped at a concentration higher than that of the ingot through the dopant supply unit. Therefore, dislocation propagation velocity may be decreased and a propagation length may be shortened.