SYSTEMS AND METHODS FOR OBJECT MEASUREMENT
    1.
    发明申请

    公开(公告)号:WO2021253940A1

    公开(公告)日:2021-12-23

    申请号:PCT/CN2021/086557

    申请日:2021-04-12

    Abstract: It is a system and a method for object measurement. The system may obtain an image of an object with a light bar acquired by an imaging device. The light bar may be formed by an optical sensor irradiating the object with a light beam. The system may obtain a measurement model. The measurement model may be configured to simulate a curved surface formed by the light beam. The system may determine position information of at least a portion of the object based at least in part on the image of the object with the light bar and the measurement model.

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