식물 내 생성 물질 검출용 SERS 나노센서와 그 제조 방법 및 SERS 나노센서를 적용한 식물 모니터링 장치 및 방법

    公开(公告)号:WO2023075502A1

    公开(公告)日:2023-05-04

    申请号:PCT/KR2022/016695

    申请日:2022-10-28

    摘要: 식물 내 생성 물질 검출용 SERS(surface-enhanced Raman scattering) 나노센서와 그 제조 방법 및 SERS 나노센서를 적용한 식물 모니터링 장치 및 방법에 관해 개시되어 있다. 개시된 식물 내 생성 물질 검출용 SERS 나노센서는 제 1 나노구조체, 상기 제 1 나노구조체의 표면에 배치되어 SERS를 유발하는 것으로, 금속을 포함하는 제 2 나노구조체 및 상기 제 2 나노구조체의 표면에 결합된 것으로, 상기 식물 내 생성 물질을 끌어당기는 인력을 발생시키는 고분자 물질을 포함할 수 있다. 상기 제 1 나노구조체는 나노입자(nanoparticle) 또는 나노튜브(nanotube) 형태를 가질 수 있다. 상기 제 2 나노구조체는 복수의 나노입자를 포함할 수 있다. 상기 고분자 물질은 PDDA [poly(diallyldimethylammonium chloride)]를 포함할 수 있다.

    一种烟丝低色度差塑料异物的脉冲光谱在线成像检测方法及其装置

    公开(公告)号:WO2023070724A1

    公开(公告)日:2023-05-04

    申请号:PCT/CN2021/128859

    申请日:2021-11-05

    申请人: 江苏大学

    摘要: 一种烟丝低色度差塑料异物的脉冲光谱在线成像检测方法及其装置,属于烟丝异物检测技术领域。主要包括烟丝负压薄层上料、烟丝脉冲线扫识别、异物正压在线剔除三个步骤;通过负压吸附力将呈松散状态且彼此间交叉交联度高的烟丝在输送滚筒(11)的表面形成固定、连续的薄层,提高了烟丝中低色度差塑料异物的被检出和剔除的概率;通过对滚筒(11)表面进行区域编码,实现了脉冲线扫识别、正压在线剔除两者间的智能联动;通过对低色度差塑料特征波长LED线阵光源(7)进行脉冲式发光,结合线扫描相机(8)可以高效、实时获取低色度差塑料异物的特征信号,克服了现有常规技术对烟丝中低色度差塑料异物检测的局限性,实现烟丝中低色度差塑料异物的高效剔除。

    FLUORESCENCE DETECTION SYSTEM
    3.
    发明申请

    公开(公告)号:WO2023069651A1

    公开(公告)日:2023-04-27

    申请号:PCT/US2022/047322

    申请日:2022-10-20

    摘要: A fluorescence detection system, including apparatus and methods, suitable for qPCR and other fluorescence-based analyses. The system may comprise various components, including a stage, an illumination module, a detection module, and an optical relay structure. The stage may be configured to support a sample holder. The illumination module may include one or more discrete light sources configured to produce excitation light. The detection module may be configured to detect fluorescence emission light produced, in response to the excitation light, by a fluorescent sample positioned in the sample holder. The optical relay structure may include a beamsplitter assembly configured to direct the excitation light from the illumination module along an illumination path to the sample holder and to direct the fluorescence emission light from the sample holder along a response path to the imaging module. The system may enhance the quality of excitation light hitting samples in the sample holder, for example, by collimating and/or homogenizing the light.

    ANONYMIZED HEALTH MONITORING PLATFORM
    8.
    发明申请

    公开(公告)号:WO2022266640A1

    公开(公告)日:2022-12-22

    申请号:PCT/US2022/072962

    申请日:2022-06-15

    申请人: OURA HEALTH OY

    摘要: Methods, systems, and devices for health monitoring platform are described. The method may include receiving physiological data continuously collected from users via wearable devices, the users being associated with respective anonymized user identifiers. The method may include identifying health risk metrics associated with each respective user based on the received physiological data, and identifying a potential health risk for at least one anonymized user identifier corresponding to at least one user based on the health risk metrics associated with the at least one user satisfying a predefined thresholds. The method may include displaying a notification of the potential health risk associated with the at least one anonymized user identifier on an administrator user device, and displaying a configurable message associated with the potential health risk on an additional user device corresponding to the at least one user.

    METHODS AND SYSTEMS FOR MEASUREMENT OF TILT AND OVERLAY OF A STRUCTURE

    公开(公告)号:WO2022265919A1

    公开(公告)日:2022-12-22

    申请号:PCT/US2022/032925

    申请日:2022-06-10

    申请人: KLA CORPORATION

    摘要: Methods and systems for measurement of wafer tilt and overlay are described herein. In some embodiments, the measurements are based on the value of an asymmetry response metric and known wafer statistics. Spectral measurements are performed at two different azimuth angles, preferably separated by one hundred eighty degrees. A sub-range of wavelengths is selected with significant signal sensitivity to wafer tilt or overlay. An asymmetry response metric is determined based on a difference between the spectral signals measured at the two different azimuth angles within the selected sub-range of wavelengths. The value of the asymmetry response metric is mapped to an estimated value of wafer tilt or overlay. In some other embodiments, the measurement of wafer tilt or overlay is based on a trained measurement model. Training data may be programmed or determined based on one or more asymmetry response metrics at two different azimuth angles.