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    AN ENERGY DISPERSIVE X-RAY DIFFRACTION ANALYSER HAVING AN IMPROVED REFLECTION GEOMETRY
    1.
    发明申请
    AN ENERGY DISPERSIVE X-RAY DIFFRACTION ANALYSER HAVING AN IMPROVED REFLECTION GEOMETRY 审中-公开

    公开(公告)号：WO2020077398A1

    公开(公告)日：2020-04-23

    申请号：PCT/AU2019/051118

    申请日：2019-10-15

    Applicant: COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION

    Inventor： TICKNER, James Richard ,  O'DWYER, Joel

    IPC: G01N23/20008 ,  G01N23/20091 ,  H01J35/00

    Abstract: An on-line energy dispersive X-ray diffraction (EDXRD) analyser for mineralogical analysis of material in a process stream or a sample is disclosed. The analyser includes a collimated X-ray source to produce a diverging beam of polychromatic X-rays, and an energy resolving X-ray detector, and a substantially X-ray transparent member having the form of a solid of revolution which is circularly symmetric about a central axis between the collimated X-ray source and the energy resolving X-ray detector, an outer surface of the X-ray transparent member positionable adjacent the material to be analysed. A primary beam collimator is disposed adjacent to or within the substantially X-ray transparent member to substantially prevent direct transmission of polychromatic X-rays emitted from the source to the detector. The analyser is configured such that the diverging beam of polychromatic X-rays are directed towards the substantially X-ray transparent member, and where the energy resolving X-ray detector collects a portion of the beam of X-rays diffracted by the material and outputs a signal containing energy information of the collected, diffracted X-rays.

    BACKSCATTER IMAGING SYSTEMS AND METHODS WITH HELICAL MOTION
    3.
    发明申请
    BACKSCATTER IMAGING SYSTEMS AND METHODS WITH HELICAL MOTION 审中-公开

    公开(公告)号：WO2018203925A1

    公开(公告)日：2018-11-08

    申请号：PCT/US2017/059599

    申请日：2017-11-01

    Applicant: CALIFORNIA INSTITUTE OF TECHNOLOGY

    Inventor： MANDRAKE, Lukas ,  LO, Martin W.

    IPC: G01N23/203 ,  G01N23/20091

    Abstract: Backscatter imaging systems and methods that involve moving an emitter and a broad spectrum detector in helical motion along a medium being imaged while the emitter emits substantially monochromatic X-rays and/or gamma rays, and the broad spectrum detector acquires intensity measurement of photons backscattered from the medium. The intensity measurements are transformed into three-dimensional image data of the medium corresponding to density variations.

    A SAMPLE INSPECTION SYSTEM
    4.
    发明申请
    A SAMPLE INSPECTION SYSTEM 审中-公开

    公开(公告)号：WO2021176197A1

    公开(公告)日：2021-09-10

    申请号：PCT/GB2021/050434

    申请日：2021-02-22

    Applicant: HALO X RAY TECHNOLOGIES LIMITED

    Inventor： DICKEN, Anthony

    IPC: G01N23/20091 ,  G01V5/00 ,  G01N23/087 ,  G01N23/10 ,  G01N23/20

    Abstract: There is presented a sample inspection system and a corresponding method for inspecting a sample. The sample inspection system includes a beam former (220), a beam modulator (240) an energy resolving detector (260) and a collimator (250). The beam former is adapted to receive an electromagnetic radiation from an electromagnetic source (210) to generate a primary beam of electromagnetic radiation. The beam modulator (240) is provided at a distance from the beam former (220) to define a sample chamber. The collimator (250) is provided between the beam modulator (240) and the energy resolving detector (260). The collimator has a plurality of channels adapted to receive diffracted or scattered radiation. Upon incidence of the primary beam onto the beam modulator, the beam modulator provides a reference beam of diffracted or scattered radiation. The energy resolving detector (260) is arranged to detect the reference beam.

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