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发明授权
CN101344572B 一种半导体功率器件斩波测试电路及方法 失效 - 权利终止 转让

一种半导体功率器件斩波测试电路及方法
摘要：
本发明公开了一种半导体功率器件斩波测试电路，采用电感作为测试负载，在对第一半导体功率器件的恢复电压进行测试时，连接电感和电源正极，在对第二半导体功率器件的恢复电压进行测试时，连接电感和电源负极。本发明还公开了一种半导体功率器件斩波测试方法，当对第一半导体功率器件进行测试时，控制第二半导体功率器件动作，测得第一半导体功率器件的恢复电压值，当对第二半导体功率器件进行测试时，控制第一半导体功率器件动作，测得第二半导体功率器件的恢复电压值。本发明所提供的测试电路及方法可以实现对半导体功率器件中续流二极管的恢复电压的有效测试。
摘要（英）：

The invention discloses a semiconductor power apparatus chopped wave test circuit adopting an inductance as a test load. When the recovery voltage of a first semiconductor power apparatus is tested, the inductance is connected with an anode of a power supply; when the recovery voltage of a second semiconductor power apparatus is tested, the inductance is connected with a cathode of the power supply. The invention also discloses a semiconductor power apparatus chopped wave test method including the following steps: when the first semiconductor apparatus is tested, the action of the second semiconductor power apparatus is controlled to get the recovery voltage of the first semiconductor power apparatus; when the second semiconductor power apparatus is tested, the action of the first semiconductor power apparatus is controlled to obtain the recovery voltage of the second semiconductor power apparatus. The test circuit and the test method provided by the invention can realize the effectivetest to the recovery voltage of a freewheeling diode in the semiconductor power apparatus.

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