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CN101714412A 一种存储器的测试系统及相关存储模块 无效 - 撤回

一种存储器的测试系统及相关存储模块
摘要：
本发明公开一种存储器的测试系统及相关存储模块。其中公开一种以数据压缩方式的测试系统，该测试系统包含第三数据端、第一编码器及第二编码器。该测试系统用来接收测试数据与测试地址以测试一存储器是否有损坏的存储单元。该存储器包含第一数据端、第二数据端与地址端。该第一编码器用来根据该测试地址，将该测试数据编码为该第一数据端对应存储单元的数据型态。该第二编码器用来根据该测试地址，将该测试数据编码为该第二数据端对应存储单元的数据型态。如此该第一数据端与该第二数据端对应存储单元皆能储存相同的测试数据。
摘要（英）：

The invention discloses a test system for a memory and a related storage module, and discloses a test system in a data compression mode. The test system comprises a third data terminal, a first coder and a second coder. The test system is used for receiving test data and test addresses to test whether the memory has a damaged storage unit or not. The memory comprises a first data terminal, a second data terminal and an address terminal. The first coder is used for coding the test data into a data pattern of a storage unit corresponding to the first data terminal according to the test address. The second coder is used for coding the test data into the data pattern of a storage unit corresponding to the second data terminal according to the test address. Therefore, both the storage units corresponding to the first data terminal and the second data terminal can store the same test data.

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