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发明公开
CN103003708A 用于测试多个被测器件的装置和方法 有权 转让

用于测试多个被测器件的装置和方法
摘要：
本发明的实施例涉及用于测试多个被测器件的装置（10）和方法，其中装置包括：公用器件输出线（5）；驱动器单元（2），被配置为向DUT（DUT1,DUT2,DUT3,…,DUTN）提供激励（ST），其中驱动器单元（2）被配置成使得激励（ST）在不同的时间（T1,T2,T3，…,TN）到达不同的DUT；从而在DUT处产生激励时间偏移（ΔST1,ΔST2,ΔST2,…,ΔSTN-1）；接收器单元（8），电气耦合到公用器件输出线（5）；以及多个DUT连接（C1,C2,C3，…,CN），电气耦合到公用器件输出线（5），使得多个DUT的DUT端子（11）可经由公用器件输出线（5）电气耦合到接收器单元（8），其中DUT输出信号（OS1,OS2,OS3,…,OSN）从DUT连接（C1,C2,C3,…,CN）传播到接收器单元（8）的输出信号传播延迟与激励时间偏移（ΔST1,ΔST2,ΔST2，…,ΔSTN-1）相适应，使得具有相同激励响应延迟的DUT的测试在接收器单元（8）处引起DUT输出信号（OS1,OS2,OS3，…,OSN）的时间上对齐的叠加（SPN-1）。
摘要（英）：

Embodiments of the invention relate to an apparatus (10) and a method for testing a plurality of devices under test wherein the apparatus comprises a common device output line (5), a driver unit (2) configured to provide a stimulus (ST) to the DUTs. (DUT1, DUT2, DUT3,..., DUTN), wherein the driver unit (2) is configured such that the stimulus (ST) reaches different DUTs, at different times (T1, T2, T3,...,TN); thereby creating stimuli time shifts ( ST1, ST2, ST2,..., STN-1) at the DUTs, a receiver unit (8) electrically coupled to the common device output line (5); and a plurality of DUT connections (C1, C2, C3..., CN), electrically coupled to the common device output line (5), so that DUT terminals (11) of the plurality of DUTs are electrically coupleable via the common output device line (5) to the receiver unit (8), wherein output signal propagation delays for DUT output signals (OS1, OS2, OS3,..., OSN), propagating from the DUT connections (C1, C2, C3..., CN) to the receiver unit (8), are adapted to the stimuli time shifts ( ST1, ST2, ST2,..., STN-1), such that a test of DUTs, having identical stimulus response delays, results in a temporally aligned superposition (SPN-1) of the DUT output signals (OS1, OS2, OS3,..., OSN) at the receiver unit (8).

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