The invention discloses a quartz crystal wafer thickness sorting machine which comprises a feeding module, a picking module, a thickness measuring module and a sorting module, wherein the picking module comprises a picking motor, the output end of the picking motor is connected with the fixed end of a picking arm, the picking motor is capable of driving the picking arm to rotate around the fixed end of the picking arm, an upper electrode is arranged at the free end of the picking arm, a feeding module is arranged at one side of the picking motor, a thickness measurement module is arranged at the other side of the picking motor, and a sorting module is arranged at one side of the thickness measurement module. According to the invention, quartz crystal wafers can be fully-automatically sorted, feeding, measurement and sorting are controlled by independent motors, the speed of wafer thickness measurement can be greatly increased, the sorting efficiency is increased, and the labor cost is reduced. The invention also discloses a quartz crystal wafer thickness sorting method.