The invention discloses a uniformity measurement device for an infrared radiation surface. The device comprises a high-resolution small light spot sampling and imaging optical system, an infrared detector, a preamplifier, a band-pass filter, a main amplifier and analogue/digital (A/D) conversion circuit, a two-dimensional precision electric control displacement system, a driving circuit for the two-dimensional precision electric control displacement system, a master control computer and a main interface circuit, wherein the high-resolution small light spot sampling and imaging optical system is used for focusing infrared radiation surface sampling points onto the infrared detector; the master control computer is used for transmitting a driving instruction to the two-dimensional precision electric control displacement system through the main interface circuit; and the infrared detector is used for converting a measured infrared radiation signal into an electrical signal, and transmitting the electrical signal to the master control computer to finish data processing through the preamplifier and the main amplifier and A/D conversion circuit. The uniformity measurement device for the infrared radiation surface is simple in structure, low in cost, high in test efficiency, speed and measurement accuracy, large in measuring point number and easy for tracing to the source.