The invention discloses a slope adaptive morphology measurement method for a microstructure workpiece, and relates to the technical field of microstructural surface shape quality detection. The method mainly comprises the steps of slope prediction, rotational scanning, error compensation, morphology reconstruction and the like. When a sample is measured, in the method a relative included angle can be automatically adjusted between a contact pin and the sample according to surface morphology changes of the measured sample, so that the scanning contact pin is enabled to adapt to slope changes of the surface of the sample, and phenomena such as outline interference and the like do not occur. The system can reconstruct surface morphology features of the sample according to an output value of a contact pin type displacement sensor, the movement amount of an XYZ micro-displacement platform, the rotation amount of a beta rotating bearing and the size of the tip radius of the contact pin after completion of scanning. Compared with an existing morphology measurement method, the method provided by the invention measures a microstructure with complex surface morphology features simply and effectively, and can reconstruct the surface morphology features of the sample accurately within a short time.