A pin for inspecting a microelectrode circuit is disclosed. The pin for inspecting a microelectrode circuit according to an embodiment of the present invention comprises: a pin, at least one of both ends of which has a contact part formed therein, the pin having a resilient part having a resilient restoring force and connecting the both ends together; and a housing having a penetration part for exposing the contact part to the outside, the housing covering the resilient part, wherein the pin and the housing are simultaneously formed by a semiconductor MEMS process so that at least one surface of lower portions and the upper portions of the pin and the housing is flat.