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发明公开
CN106841976A 一种测试模拟开关通道转换无效输出时间的装置 无效 - 驳回

一种测试模拟开关通道转换无效输出时间的装置
摘要：
本发明公开了一种测试模拟开关通道转换无效输出时间的装置，包括与模拟电压产生模块、电压检测模块、测试板模块、电源和双踪示波器；其中模拟电压产生模块、电压检测模块、测试板模块分别与待测模拟开关的输入端连接，其中待测模拟开关为多路通道模拟开关，待测模拟开关与电源连接，待测模拟开关的输出端还与双踪示波器连接；其中待测模拟开关的输出端还连接有负载电阻和负载电容。能够用来表征模拟开关在高速应用时切换通道的效率，能够提升模拟开关在高速、高精度相关技术领域的应用及发展，为该通用电路更好的服务现代高新电子产业发展做好支撑。
摘要（英）：

The invention discloses an analog switch channel switching invalid output time testing device. The analog switch channel switching invalid output time testing device comprises an analog voltage generating module, a voltage detecting module, a testing panel module, a power supply and a dual-trace oscilloscope, wherein the analog voltage generating module, the voltage detecting module and the testing panel module are connected with the input end of an analog switch to be tested, which is a multi-channel analog switch connected with the power supply, and the output end of the analog switch to be tested is connected to the dual-trace oscilloscope and connected with a load resistor and a load capacitor. The analog switch channel switching invalid output time testing device can demonstrate the channel switching efficiency of the analog switch during high-speed application, improve the application and development of the analog switch in high-speed and high-precision relevant technical fields and provide support for achieve better service of universal circuits in development of advanced and new electronic industry.

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