The invention provides a flexible probe, which comprises a supporting arm, a flexible contact probe and a flexible connection point. Flexible connection is fixed or detachable. The flexible contact probe has a two-dimensional or three-dimensional structure. The flexible contact probe is in a shape of a tobacco pipe or a spoon and the spatial volume is 1 mum<3> to 0.1 m<3>. The probe of the invention has a fixed or detachable flexible contact point, and a damaged probe can be replaced; the two-dimensional or three-dimensional tobacco pipe-shaped or spoon-shaped structure is adopted to replace a one-dimensional contact structure in the prior art, and the chip surface metal layer and an electric device can be prevented from being damaged during a chip test process; the contact surface between the probe and the chip is large, current can be distributed more uniformly during a high current device test process, charged striking of the one-dimensional point-shaped probe point to burn down the device can be avoided, and the safety of the electric device chip-level test process can be improved significantly.