The invention relates to a method for adjusting a cantilever probe card needle trace. The tail of a probe and a probe card board welding point are welded together through copper wires, the welding point is connected with channel resources of a test machine, a needle tip is in contact with a pin on a wafer chip to carry out a test, an insulating grid fixing device is fixed to the probe card board, a protruding rectangle is arranged on a needle arm, and the rectangle is cut in a grid in the grid fixing device to fix the probe; and when a needle trace needs to be adjusted, a cover plate on the grid fixing device is opened, an adjustment direction is judged according to the actual needle trace generated by needle insertion and given by a probe station, and by virtue of a magnifying lens, the specific position of an original grid is remembered, then grids in the mesh fixing device are adjusted towards a direction to which the needle trace needs to be adjusted, then the rectangle on the needle arm is cut in the adjusted mesh, the cover plate is closed again, and thus adjustment is completed. The mesh fixing device is utilized to replace an epoxy resin part of the cantilever probe card, thereby achieving the purpose of accurately adjusting the needle trace, the difficulty of operation is lowered, time and cost are saved, and the efficiency is improved.