This inspection jig, which is for bringing a probe Pr into contact with an inspection point provided on a substrate to be inspected, is provided with: an inspection-side support having a counter plate 51 provided with a facing surface F disposed to face the substrate; and an electrode-side support 6 having supporting plates 61-63 disposed to face an electrode plate 9 positioned opposite the facing surface F of the counter plate 51. A probe supporting hole 23, in which the rear end portion of the probe Pr is inserted and supported, is provided in the supporting plates 61-63, and the probe supporting hole 23 is provided with a restricting surface which is formed along a supporting line V inclined at a certain angle θ with respect to a reference line Z in the direction perpendicular to the facing surface F of the counter plate 51, and which restricts the rear end portion of the probe Pr from moving in the direction perpendicular to the inclined direction of the supporting line V.