The invention discloses a photon radiation microscope sample holder, which comprises a substrate, metal electrodes, and bonding wires, wherein the substrate is provided with a sample bearing area forbearing a sample; the sample bearing area penetrates through the substrate along the vertical direction; a bearing plate made of a light-transmitting material is arranged in the sample bearing area; the metal electrode is arranged in the substrate and penetrates through the substrate in the vertical direction; and the bonding wire is used for electrically connecting the pricking area of the to-be-tested sample with the metal electrode. According to the invention, the original front/back detection type EMMI/OBIRCH application analysis equipment has the capability of carrying out analysis and application from two sides. The defect position can be more conveniently, quickly and accurately positioned.