发明公开
- 专利标题： Lift-off compensation of eddy current probes
- 专利标题（中）： 涡流样品中Abhebeeffekts的补偿。
-
申请号： EP83109668.0申请日： 1983-09-28
-
公开(公告)号： EP0116116A2公开(公告)日： 1984-08-22
- 发明人: Bains, James A., Jr.
- 申请人： AMF INCORPORATED
- 申请人地址： World Headquarters 777 Westchester Avenue White Plains New York 10604 US
- 专利权人： AMF INCORPORATED
- 当前专利权人： AMF INCORPORATED
- 当前专利权人地址： World Headquarters 777 Westchester Avenue White Plains New York 10604 US
- 代理机构： Eisenführ, Speiser & Partner
- 优先权： US457321 19830111
- 主分类号： G01N27/90
- IPC分类号： G01N27/90
摘要：
This invention relates to a method and apparatus for compensating the output signal of a reflection type eddy current probe so as to minimize the change in the phase shift of the probe output signal that otherwise would occur as a result of a change in the spacing of the probe from the surface of the metal sample being inspected or investigated.
公开/授权文献
- EP0116116B1 Lift-off compensation of eddy current probes 公开/授权日：1988-09-07
信息查询
