公开(公告)号：EP0116116B1

公开(公告)日：1988-09-07

申请号：EP83109668.0

申请日：1983-09-28

申请人： AMF INCORPORATED

发明人： Bains, James A., Jr.

IPC分类号： G01N27/90

CPC分类号： G01V3/105 ,  G01N27/906

公开(公告)号：EP0116116A3

公开(公告)日：1985-04-03

申请号：EP83109668

申请日：1983-09-28

申请人： AMF INCORPORATED

发明人： Bains, James A., Jr.

IPC分类号： G01N27/90

CPC分类号： G01V3/105 ,  G01N27/906

摘要： This invention relates to a method and apparatus for compensating the output signal of a reflection type eddy current probe so as to minimize the change in the phase shift of the probe output signal that otherwise would occur as a result of a change in the spacing of the probe from the surface of the metal sample being inspected or investigated.

公开(公告)号：EP0116116A2

公开(公告)日：1984-08-22

申请号：EP83109668.0

申请日：1983-09-28

申请人： AMF INCORPORATED

发明人： Bains, James A., Jr.

IPC分类号： G01N27/90

CPC分类号： G01V3/105 ,  G01N27/906

摘要： This invention relates to a method and apparatus for compensating the output signal of a reflection type eddy current probe so as to minimize the change in the phase shift of the probe output signal that otherwise would occur as a result of a change in the spacing of the probe from the surface of the metal sample being inspected or investigated.