发明授权
- 专利标题: Method for fabricating interlevel contacts
- 专利标题(中): 一种用于生产夹层接触方法
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申请号: EP90309523.0申请日: 1990-08-30
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公开(公告)号: EP0430403B1公开(公告)日: 1998-01-07
- 发明人: Chen, Fusen E. , Liou, Fu-Tai , Turner, Timothy Edward , Wei, Che-Chia , Lin, Yih-Shung , Dixit, Girish Anant
- 申请人: SGS-THOMSON MICROELECTRONICS, INC.
- 申请人地址: 1310 Electronics Drive Carrollton Texas 75006 US
- 专利权人: SGS-THOMSON MICROELECTRONICS, INC.
- 当前专利权人: SGS-THOMSON MICROELECTRONICS, INC.
- 当前专利权人地址: 1310 Electronics Drive Carrollton Texas 75006 US
- 代理机构: Palmer, Roger
- 优先权: US443898 19891130
- 主分类号: H01L21/768
- IPC分类号: H01L21/768 ; H01L21/60 ; H01L21/285 ; H01L23/532
公开/授权文献
- EP0430403A3 Method for fabricating interlevel contacts 公开/授权日:1992-03-11
信息查询
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