发明公开
EP0852229A2 Precursor with (methoxy) (methyl) silylolefin ligands to deposit copper and method for the same
失效
甲氧基甲硅烷基烯属配体enthaltendeVorlaüferverbindungenzur Abscheiden von Kupfer
- 专利标题: Precursor with (methoxy) (methyl) silylolefin ligands to deposit copper and method for the same
- 专利标题(中): 甲氧基甲硅烷基烯属配体enthaltendeVorlaüferverbindungenzur Abscheiden von Kupfer
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申请号: EP97308824.8申请日: 1997-11-04
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公开(公告)号: EP0852229A2公开(公告)日: 1998-07-08
- 发明人: Senzaki, Yoshihide , Charneski, Lawrence Joel , Kobayashi, Masato , Nguyen, Tue
- 申请人: SHARP KABUSHIKI KAISHA , SHARP MICROELECTRONICS TECHNOLOGY, INC.
- 申请人地址: 22-22 Nagaike-cho, Abeno-ku Osaka-shi, Osaka-fu 545 JP
- 专利权人: SHARP KABUSHIKI KAISHA,SHARP MICROELECTRONICS TECHNOLOGY, INC.
- 当前专利权人: SHARP KABUSHIKI KAISHA,SHARP MICROELECTRONICS TECHNOLOGY, INC.
- 当前专利权人地址: 22-22 Nagaike-cho, Abeno-ku Osaka-shi, Osaka-fu 545 JP
- 代理机构: West, Alan Harry
- 优先权: US779640 19970107
- 主分类号: C07F7/18
- IPC分类号: C07F7/18 ; C23C16/18
摘要:
Copper is applied to integrated circuit substrates, for example, by chemical vapor deposition using a copper precursor of a dimethoxymethylvinylsilane (dmomvs), or a methoxydimethylvinylsilane (modmvs) silylolefin ligand bonded to (hfac)Cu. The improved copper complex-ligand bond helps ensure that the ligand separates from the (hfac)Cu complex at consistent temperatures when Cu is to be deposited. Water vapor may be added to the precursor to improve the conductivity of the deposited Cu, and additional silylolefins, hexafluoroacetylacetone (H-hfac), and water may be used separately or in combination to enhance deposition rate, conductivity, and precursor stability.
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