发明公开
EP0878908A3 Semiconductor device using complementary clock and signal input state detection circuit used for the same
失效
Halbleitervorrichtung mitkomplementäremTakt und Schaltung zur Detektion des Eingangssignalzustandesdafür
- 专利标题: Semiconductor device using complementary clock and signal input state detection circuit used for the same
- 专利标题(中): Halbleitervorrichtung mitkomplementäremTakt und Schaltung zur Detektion des Eingangssignalzustandesdafür
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申请号: EP97307632.6申请日: 1997-09-29
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公开(公告)号: EP0878908A3公开(公告)日: 1999-01-20
- 发明人: Taguchi, Masao , Tomita, Hiroyoshi , Matsuzaki, Yasurou
- 申请人: FUJITSU LIMITED
- 申请人地址: 1-1, Kamikodanaka 4-chome, Nakahara-ku Kawasaki-shi, Kanagawa 211-8588 JP
- 专利权人: FUJITSU LIMITED
- 当前专利权人: FUJITSU LIMITED
- 当前专利权人地址: 1-1, Kamikodanaka 4-chome, Nakahara-ku Kawasaki-shi, Kanagawa 211-8588 JP
- 代理机构: Stebbing, Timothy Charles
- 优先权: JP103375/97 19970421
- 主分类号: H03K5/151
- IPC分类号: H03K5/151 ; G11C7/00
摘要:
A semiconductor device for generating first and second internal clocks complementary with each other from an external clock and usable for both a system of a type using a complementary clock and a system of a type generating a 180° phase clock internally, is disclosed. A first clock input circuit (buffer) (11) is supplied with a first eternal clock (CLK) and outputs a first internal clock (CLK1). A second clock input circuit (buffer) (12) is supplied with a second external clock (/CLK) complementary with the first external clock and outputs a second clock. A 1/2 phase clock generating circuit (22) generates a 1/2 phase shift signal 180° out of phase with the first internal clock (CLK). A second external clock state detection circuit judges whether the second external clock (/CLK) is input to the second clock input buffer. A switch (23) is operated to produce the second clock as the second internal clock when the second external clock is input and to produce the 1/2 phase shift signal as the second internal clock when the second external clock is not input, in accordance with the judgement at the second external clock state detection circuit.
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