发明授权
- 专利标题: Flash memory with improved erasability and its circuitry
- 专利标题(中): 闪存具有更好的可擦及其电路
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申请号: EP99115179.6申请日: 1992-12-09
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公开(公告)号: EP0961289B1公开(公告)日: 2002-10-02
- 发明人: Akaogi, Takao , Kawashima, Hiromi , Takeguchi, Tetsuji , Hagiwara, Ryoji , Kasa, Yasushi , Itano, Kiyoshi , Kawamura, Shouichi , Ogawa, Yasushige
- 申请人: FUJITSU LIMITED
- 申请人地址: 1-1, Kamikodanaka 4-chome, Nakahara-ku Kawasaki-shi, Kanagawa 211-8588 JP
- 专利权人: FUJITSU LIMITED
- 当前专利权人: FUJITSU LIMITED
- 当前专利权人地址: 1-1, Kamikodanaka 4-chome, Nakahara-ku Kawasaki-shi, Kanagawa 211-8588 JP
- 代理机构: Hitching, Peter Matthew
- 优先权: JP32470191 19911209; JP34657191 19911227; JP467892 19920114; JP6414392 19920319; JP14530092 19920605; JP15495892 19920615; JP25659492 19920925; JP29998792 19921110
- 主分类号: G11C16/06
- IPC分类号: G11C16/06 ; H03K19/21 ; G11C5/14
摘要:
A negative-voltage bias circuit is provided which comprises: a capacitor (550) having first and second terminals (550B, 550A) ; a first p-channel MIS field-effect transistor (551) whose drain is connected to a negative-voltage output terminal (554) and whose gate and source are connected to the first terminal (550B) of the capacitor (550); and a second p-channel MIS field-effect transistor (552) whose drain is connected to the source of the first p-channel MIS field effect transistor (551), whose gate is connected to the negative-voltage output terminal (554), and whose source is provided with a negative voltage (VBB). The first p-channel MIS field-effect transistor (551) is a depletion-type p-channel MIS field-effect transistor. In operation of the circuit, application to the second terminal (550A) of a series of clock pulses (CLK) causes a potential of the negative-voltage output terminal (554) to tend towards the negative voltage (VBB).
公开/授权文献
- EP0961289A3 Flash memory with improved erasability and its circuitry 公开/授权日:2000-02-02
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