发明公开
EP1048755A1 PLATING DEVICE AND METHOD OF CONFIRMING CURRENT FEED
审中-公开
平顶山庄VERFHREN ZURBESTÄTIGUNGDER STROMZUFUHR
- 专利标题: PLATING DEVICE AND METHOD OF CONFIRMING CURRENT FEED
- 专利标题(中): 平顶山庄VERFHREN ZURBESTÄTIGUNGDER STROMZUFUHR
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申请号: EP98961353.4申请日: 1998-12-16
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公开(公告)号: EP1048755A1公开(公告)日: 2000-11-02
- 发明人: YOSHIOKA, Junichiro , SENDAI, Satoshi , CHONO, Atsushi , TADA, Mitsuo , HONGO, Akihisa , MUKAIYAMA, Yoshitaka , TOMIOKA, Kenya , OGATA, Akira , SUZUKI, Kenichi , OZAWA, Naomitsu
- 申请人: Ebara Corporation
- 申请人地址: 11-1, Haneda Asahi-cho, Ohta-ku Tokyo 144-8510 JP
- 专利权人: Ebara Corporation
- 当前专利权人: Ebara Corporation
- 当前专利权人地址: 11-1, Haneda Asahi-cho, Ohta-ku Tokyo 144-8510 JP
- 代理机构: Wagner, Karl H., Dipl.-Ing.
- 优先权: JP36394497 19971216; JP19593298 19980710
- 国际公布: WO9931304 19990624
- 主分类号: C25D17/08
- IPC分类号: C25D17/08 ; C25D5/08 ; C25D21/12 ; G01R27/02
摘要:
The present invention provides a conductivity sensing device capable of detecting the conductivity (contact state) of the plurality of feeder contacts contacting the conductive area of the substrate, and a plating apparatus capable of forming a plating film of uniform thickness by supplying a uniform plating current through a plurality of feeder contacts.
In the plating apparatus, an anode 13 is disposed in a plating bath; a substrate 12 is mounted in a jig and disposed in the plating bath opposite the anode 13; and a plurality of feeder contacts 15 is contacting the conductive region formed on the surface of the substrate 12. A predetermined voltage is applied between the anode 13 and feeder contacts 15 to supply a plating current through the feeder contacts 15 for plating the substrate 12. The plating apparatus also includes a conductivity sensor 22 for detecting the state of conductivity between each of the feeder contacts 15 and the conductive region on the substrate 12.
In the plating apparatus, an anode 13 is disposed in a plating bath; a substrate 12 is mounted in a jig and disposed in the plating bath opposite the anode 13; and a plurality of feeder contacts 15 is contacting the conductive region formed on the surface of the substrate 12. A predetermined voltage is applied between the anode 13 and feeder contacts 15 to supply a plating current through the feeder contacts 15 for plating the substrate 12. The plating apparatus also includes a conductivity sensor 22 for detecting the state of conductivity between each of the feeder contacts 15 and the conductive region on the substrate 12.
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