摘要:
The present invention provides a substrate plating apparatus capable of forming a plating layer on the surface of a substrate and storing the substrate until the next process in a way that the substrate is not exposed to the atmosphere. Also, the present invention provides a substrate plating apparatus not only capable of performing a process to introduce semiconductor wafers continuously one by one into the plating apparatus without loading the wafers into cassettes, and also capable of preventing particle contamination and the formation of oxidized film on the surface of the wafers; reducing the number of processes; and reducing the installation area required for the apparatus. A substrate plating apparatus that includes a plating process section(20) for plating a substrate; a washing process section(10) for washing the substrate after the plating process; and a storage vessel(16) containing a storing solution in which the substrate is immersed after having been plated and washed. A substrate conveyor is provided in the substrate plating apparatus for loading substrates into the substrate plating apparatus and discharging substrates out of the substrate plating apparatus, or for performing at least one of the loading or discharging operations, such that the substrates are loaded into the substrate plating apparatus one at a time, plated in the plating process section, washed in the washing process section, and subsequently discharged one at a time from the substrate plating apparatus.
摘要:
The present invention is to provide a copper damascene plating method for efficiently filling fine wiring trenches and via holes formed in a surface of a substrate without using special machines or electrical facilities, while preventing from generation of air bubbles. The plating method for filling trenches or via holes formed in a surface of a substrate with copper plating, comprises: performing electrolytic plating using a plating solution comprising copper sulfate (CuSO 4 ·5H 2 O) having a concentration of 4-250 g/l, sulfuric acid (H 2 SO 4 ) having a concentration of 10-200 g/l, and chlorine ions having a concentration of 0-100 mg/l. In addition, a sulfur compound additive can be mixed in to make the solution more suitable for copper damascene plating, wherein the concentration of the additive is selected based on the ratio of sulfuric acid/hydrated copper sulfate.
摘要:
A method and apparatus for plating a substrate is provided, wherein fine pits formed in the substrate, such as fine channels for wiring, are filled with a copper, copper alloy, or other material with low electrical resistance. The method is performed on a wafer W having fine pits (10) to fill the fine pits with a metal (13) and includes performing a first plating process (11) by immersing the wafer in a first plating solution having a composition superior in throwing power; and performing a second plating process (12) by immersing the substrate in a second plating solution having a composition superior in leveling ability.
摘要:
The present invention relates to an electroless plating apparatus which can easily form a plated film having more uniform thickness on a surface, to be plate, of a material to be plated. The present invention comprises a holding portion (10) having a heating portion (14) for holding a material to be plated in such a state that a surface to be plated faces downward, and a plating bath (24) for introducing an electroless plating liquid (22) having a predetermined temperature into a plating chamber (28), and holding the electroless plating liquid while allowing the electroless plating liquid to overflow an overflow dam, wherein the material, to be plated, held by the holding portion (10) is brought into contact with the plating liquid (22) in the plating bath (24) to plate the material.
摘要:
An object of the present invention is to provide a substrate plating apparatus employing an insoluble anode, and particularly a substrate plating apparatus capable of easily and automatically supplying metal ions. It is another object of the present invention to provide a substrate plating apparatus capable of supplying a uniform primary current distribution between the cathode and anode and facilitating reduction of the size of the plating apparatus. It is further another object of the present invention to provide a plating apparatus capable of preventing the substrate from being contaminated by particles produced from black film, even when using a soluble anode. The present invention relates to a substrate plating apparatus for plating a substrate in a plating bath containing plating solution, an insoluble anode being disposed in the plating bath opposite the substrate, the substrate plating apparatus comprising: a circulating vessel or dummy vessel provided separate from the plating bath, a soluble anode and a cathode being disposed in the circulating vessel or dummy vessel, an anion exchange film or selective cation exchange film being disposed between the anode and cathode and isolating the same; wherein metal ions are generated in the circulating vessel or dummy vessel by flowing current between the soluble anode and the cathode therein, and generated metal ions are supplied to the plating bath. A substrate plating apparatus comprises an ion exchange film or neutral porous diaphragm disposed between the substrate and anode in the plating bath; wherein the ion exchange film or neutral porous diaphragm divides the plating bath into a substrate region and an anode region.
摘要:
The present invention provides a conductivity sensing device capable of detecting the conductivity (contact state) of the plurality of feeder contacts contacting the conductive area of the substrate, and a plating apparatus capable of forming a plating film of uniform thickness by supplying a uniform plating current through a plurality of feeder contacts. In the plating apparatus, an anode 13 is disposed in a plating bath; a substrate 12 is mounted in a jig and disposed in the plating bath opposite the anode 13; and a plurality of feeder contacts 15 is contacting the conductive region formed on the surface of the substrate 12. A predetermined voltage is applied between the anode 13 and feeder contacts 15 to supply a plating current through the feeder contacts 15 for plating the substrate 12. The plating apparatus also includes a conductivity sensor 22 for detecting the state of conductivity between each of the feeder contacts 15 and the conductive region on the substrate 12.