发明公开
EP1109029A1 Apparatus and method using photoelectric effect for testing electrical traces
审中-公开
装置和方法的光电效应测试电气连接的目的,好处
- 专利标题: Apparatus and method using photoelectric effect for testing electrical traces
- 专利标题(中): 装置和方法的光电效应测试电气连接的目的,好处
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申请号: EP00108285.8申请日: 2000-04-14
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公开(公告)号: EP1109029A1公开(公告)日: 2001-06-20
- 发明人: Cugini, Mario A. , Brakley, Jeff , Ravich, Gilbert Norman , Miles, George E. III , Giusti, Ralph Lynn
- 申请人: MANIAtech, Inc.
- 申请人地址: 1198 Joshua Way Vista, California 92083 US
- 专利权人: MANIAtech, Inc.
- 当前专利权人: MANIAtech, Inc.
- 当前专利权人地址: 1198 Joshua Way Vista, California 92083 US
- 代理机构: Klunker . Schmitt-Nilson . Hirsch
- 优先权: US461801 19991215
- 主分类号: G01R31/265
- IPC分类号: G01R31/265
摘要:
A tester (10) for electrical traces (85) such as on a circuit board (80) includes an electromagnetic beam source (20) such as a laser producing an ultraviolet beam (24), a vacuum chamber (12), an electrode circuit (49) including electrodes (51) and corresponding electronics (55) including ammeters (59) for measuring photoelectron flow between traces (85) and electrodes (51), a controller (71), laser beam optics (41, 44, 46), an image acquisition system, and a pair of broadband UV lights. The board containing traces (85) under test is disposed in the vacuum chamber (12) at lowered pressure with grid electrodes (51) lying close to the trace area (85) on each side of the board. Electrode electronics (55) selectively maintain a known potential on each electrode (51). The exact location of traces (85) are determined by an image acquisition system. The board (80) and traces (85) are initialized to a known voltage. Photoelectric effect using ultraviolet laser beams (24) is used to determine continuity between two points (87) on a trace (85) and shorts between traces (85).
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