A probe for vertical scanning microscope in which the forward end of a nanotube, serving as a probe, abuts against the sample surface substantially perpendicularly thereto and detects the surface information of the sample with high sensitivity. The inventive probe for vertical scanning microscope is characterized in that a cantilever 2 is provided with a fixing region for bonding the base end part 14 of a nanotube 12 in a probe 20 for scanning microscope which obtains the physical information of the sample surface 24 at the forward end of a nanotube bonded to the cantilever 2, height direction of the fixing region is substantially perpendicular to the mean sample surface 26 when the cantilever 2 is set in the measuring state with respect to the mean sample surface 26 and the base end part 14 of the nanotube 12 is bonded in the height direction of the fixing region.