发明公开
- 专利标题: A TUNNELING SENSOR OR SWITCH AND A METHOD OF MAKING SAME
- 专利标题(中): 一种隧道传感器或开关及其制造方法
-
申请号: EP01957352.6申请日: 2001-07-30
-
公开(公告)号: EP1305257A2公开(公告)日: 2003-05-02
- 发明人: KUBENA, Randall, L. , CHANG, David, T.
- 申请人: HRL LABORATORIES, LLC
- 申请人地址: 3011 Malibu Canyon Road Malibu, CA 90265-4799 US
- 专利权人: HRL LABORATORIES, LLC
- 当前专利权人: HRL LABORATORIES, LLC
- 当前专利权人地址: 3011 Malibu Canyon Road Malibu, CA 90265-4799 US
- 代理机构: Ebner von Eschenbach, Jennifer
- 优先权: US629682 20000801
- 国际公布: WO02010063 20020207
- 主分类号: B81B3/00
- IPC分类号: B81B3/00 ; B81C1/00 ; H01H1/00 ; H01J37/28
摘要:
A method of making a micro electo-mechanical switch or tunneling sensor. A cantilevered beamstructure and a mating structure are defined on an etch stop layer on a first substrate or wafer;and at least one contact structure and a mating structure are defined on a second substrate orwafer, the mating structure on the second substrate or wafer being of a complementary shape tothe mating structure on the first substrate or wafer. A bonding layer, preferably a eutecticbonding layer, is provided on at least one of the mating structures. The mating structure of thefirst substrate is moved into a confronting relationship with the mating structure of the secondsubstrate or wafer. Pressure is applied between the two substrates so as to cause a bond to occur between the two mating structures at the bonding or eutectic layer. Then the first substrate or wafer and the etch stop layer are removed to free the cantilevered beam structure for movement relative to the second substrate or wafer.
信息查询