Invention Publication
- Patent Title: Method and apparatus for providing fault-tolerance for temporary results within a central processing unit
- Patent Title (中): 用于容错临时结果提供给中央处理单元的方法和装置
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Application No.: EP03252741.8Application Date: 2003-04-30
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Publication No.: EP1369786A3Publication Date: 2005-03-23
- Inventor: Tremblay, Marc , Chaudhry, Shailender , Jacobson, Quinn A.
- Applicant: Sun Microsystems, Inc.
- Applicant Address: 4150 Network Circle Santa Clara, California 95054 US
- Assignee: Sun Microsystems, Inc.
- Current Assignee: Sun Microsystems, Inc.
- Current Assignee Address: 4150 Network Circle Santa Clara, California 95054 US
- Agency: Davies, Simon Robert
- Priority: US146102 20020514
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F11/14 ; G06F9/38
Abstract:
One embodiment of the present invention provides a system that corrects bit errors in temporary results within a central processing unit (CPU). During operation, the system receives a temporary result during execution of an in-flight instruction. Next, the system generates a parity bit for the temporary result, and stores the temporary result and the parity bit in a temporary register within the CPU. Before the temporary result is committed to the architectural state of the CPU, the system checks the temporary result and the parity bit to detect a bit error. If a bit error is detected, the system performs a micro-trap operation to re-execute the instruction that generated the temporary result, thereby regenerating the temporary result. Otherwise, if a bit error is not detected, the system commits the temporary result to the architectural state of the CPU.
Public/Granted literature
- EP1369786B1 Method and apparatus for providing fault-tolerance for temporary results within a central processing unit Public/Granted day:2006-12-13
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