发明公开
- 专利标题: METHOD FOR FORMING FINE PATTERN
- 专利标题(中): 法形成组织微细化
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申请号: EP02746013申请日: 2002-07-12
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公开(公告)号: EP1413927A4公开(公告)日: 2006-06-21
- 发明人: TORIUMI MINORU , YAMAZAKI TAMIO , WATANABE HIROYUKI , ITANI TOSHIRO , ARAKI TAKAYUKI , ISHIKAWA TAKUJI
- 申请人: SEMICONDUCTOR LEADING EDGE TEC , DAIKIN IND LTD
- 专利权人: SEMICONDUCTOR LEADING EDGE TEC,DAIKIN IND LTD
- 当前专利权人: SEMICONDUCTOR LEADING EDGE TEC,DAIKIN IND LTD
- 优先权: JP2001212696 2001-07-12; JP2001280463 2001-09-14
- 主分类号: G03F7/004
- IPC分类号: G03F7/004 ; G03F7/023 ; G03F7/039 ; H01L21/027
摘要:
A method for forming a fine pattern which comprises a step of forming a photosensitive layer on a substrate or a predetermined layer on a substrate by the use of a photosensitive composition comprising a compound capable of producing an acid through the irradiation thereof with a light and a fluorine−containing polymer containing a norbornene derivative unit having an OH group or a functional group capable of converting to an OH group by the action of an acid, an exposure step of selectively irradiating a predetermined region of the above photosensitive layer with an energy ray, a step of treating with heat the photosensitive layer after exposure, and a step of subjecting the photosensitive layer after heat treatment to a development treatment to remove selectively an exposed portion or an unexposed portion of the photosensitive layer. The method is advantageous in that it uses as a resist a photosensitive composition comprising a material exhibiting high transparency with respect to an exposure light of a short wave length, such as F 2 excimer laser, and having high practical utility.
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