A monitoring control device which tests integrated circuits which are mounted on a CPU substrate (4) or control substrate (5) and support a boundary scan test method and also tests the connecting relations of the integrated circuit by means of a boundary scan controller substrate (7) as shown in the figure. When the abnormality of the CPU substrate (4) or control substrate (5) is found, the device actuates an alarm device (9) to issue an alarm. In addition, when the abnormality gives a serious influence on the operation of a robot (3) to be monitored and controlled, the device prevents the robot from running out of control by turning off the main power unit (6) of the robot (2) from the fail-safe point of view.