Invention Publication
EP1774531A4 PROGRAMMABLE SEMI-FUSIBLE LINK READ ONLY MEMORY AND METHOD OF MARGIN TESTING SAME
审中-公开
可编程半熔化LINKS读数存储器和方法糖耐量试验THEREOF
- Patent Title: PROGRAMMABLE SEMI-FUSIBLE LINK READ ONLY MEMORY AND METHOD OF MARGIN TESTING SAME
- Patent Title (中): 可编程半熔化LINKS读数存储器和方法糖耐量试验THEREOF
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Application No.: EP05778107Application Date: 2005-08-02
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Publication No.: EP1774531A4Publication Date: 2008-09-03
- Inventor: BRENNAN OLIVER , DOYLE DENIS
- Applicant: ANALOG DEVICES INC
- Assignee: ANALOG DEVICES INC
- Current Assignee: ANALOG DEVICES INC
- Priority: US91185304 2004-08-05
- Main IPC: G11C17/00
- IPC: G11C17/00 ; G11C17/18
Abstract:
A programmable read only memory includes a matrix of semi-fusible link memory cells, each including a semi-fusible link having an intact impedance and a blown impedance; a bit line voltage supply switching circuit for applying a current to at least one selected bit line; a word line address decoder for selecting a word line; and a program control logic circuit for blowing the semi-fusible links in the memory cells identified by the intersection of the selected word and bit lines; a method is disclosed of testing programmed and unprogrammed read only memory.
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