发明公开
- 专利标题: Phase detector
- 专利标题(中): 相位检测器
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申请号: EP07108304.2申请日: 2001-07-02
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公开(公告)号: EP1816741A1公开(公告)日: 2007-08-08
- 发明人: Staszewski, Robert B. , Leipold, Dirk
- 申请人: Texas Instruments Incorporated
- 申请人地址: 7839 Churchill Way Mail Station 3999 Dallas, Texas 75251 US
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: 7839 Churchill Way Mail Station 3999 Dallas, Texas 75251 US
- 代理机构: Holt, Michael
- 优先权: US608317 20000630
- 主分类号: H03D13/00
- IPC分类号: H03D13/00 ; H03L7/091 ; H03L7/085
摘要:
There is provided a digital fractional phase detector (200) comprising a first input to receive an oscillator clock signal (CKV) and a second input to receive a frequency reference clock signal (FREF). A time-to-digital converter TDC (201) is coupled to said first input and said second input, said TDC producing a signal indicative of timing difference between said oscillator clock signal and said frequency clock signal. A normalizer (NORM) is coupled to said TDC (201), said normalizer producing an output, wherein said output is normalized to a period of said oscillator clock signal. Also provided is a method of generating a fractional phase error signal whereby a timing difference between an oscillator clock signal and a frequency reference clock signal is obtained, and then normalizing said timing difference to a period of said oscillator clock signal.
公开/授权文献
- EP1816741B1 Phase detector 公开/授权日:2018-10-03
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