发明公开
EP2269215A1 METHOD FOR FABRICATING A SEMICONDUCTOR ON INSULATOR TYPE SUBSTRATE
审中-公开
一种用于生产板型绝缘体上半导体
- 专利标题: METHOD FOR FABRICATING A SEMICONDUCTOR ON INSULATOR TYPE SUBSTRATE
- 专利标题(中): 一种用于生产板型绝缘体上半导体
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申请号: EP09719620.8申请日: 2009-01-29
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公开(公告)号: EP2269215A1公开(公告)日: 2011-01-05
- 发明人: MALEVILLE, Christophe
- 申请人: S.O.I.Tec Silicon on Insulator Technologies
- 申请人地址: Parc Technologique des Fontaines Chemin des Franques 38190 Bernin FR
- 专利权人: S.O.I.Tec Silicon on Insulator Technologies
- 当前专利权人: S.O.I.Tec Silicon on Insulator Technologies
- 当前专利权人地址: Parc Technologique des Fontaines Chemin des Franques 38190 Bernin FR
- 代理机构: Collin, Jérôme
- 优先权: FR0851566 20080311
- 国际公布: WO2009112306 20090917
- 主分类号: H01L21/762
- IPC分类号: H01L21/762
摘要:
The present invention relates to a method forfabricating a substrate (1) of semiconductor on insulatortype, comprising the following steps: - formation of an oxide layer (20) on a donor substrate (10) or a receiver substrate (30), - implantation of atomic species in the donor substrate so as to form a weakened zone(12), - bonding of the donor substrate onto the receiver substrate (30), the oxide layer (20) being at the bonding interface, - fracturing the donor substrate in the weakened zone (12) and transferring a layer of the donor substrate to the receiver substrate (30), - recycling of the remainder (2) of the donor substrate to form a receiver substrate (40) used for fabrication of a second semiconductor on insulator type 10 substrate. Before the oxidation step, a layer(14) of semiconducting materialis formed by epitaxy onthedonor substrate (10). In the implantation step, the weakened zone (12) formed in said epitaxied layer (14) so that the transferred layer is an epitaxied semiconducting material layer (140). And the donor substrate (10) is chosen comprising oxygen precipitates with a density of less than10
10 /cm
3 and/or a mean size of less than 500 nm.
10 /cm
3 and/or a mean size of less than 500 nm.
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