发明公开
- 专利标题: MAGNETIC TUNNEL JUNCTION (MTJ) AND METHODS, AND MAGNETIC RANDOM ACCESS MEMORY (MRAM) EMPLOYING SAME
- 专利标题(中): 磁性隧道过渡和方法及其
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申请号: EP10765114.3申请日: 2010-04-14
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公开(公告)号: EP2419933A2公开(公告)日: 2012-02-22
- 发明人: ZHU, Xiaochun , NOWAK, Matthew , LI, Xia , KANG, Seung H.
- 申请人: QUALCOMM Incorporated
- 申请人地址: Attn: International IP Administration 5775 Morehouse Drive San Diego, CA 92121 US
- 专利权人: QUALCOMM Incorporated
- 当前专利权人: QUALCOMM Incorporated
- 当前专利权人地址: Attn: International IP Administration 5775 Morehouse Drive San Diego, CA 92121 US
- 代理机构: Dunlop, Hugh Christopher
- 优先权: US423298 20090414
- 国际公布: WO2010120918 20101021
- 主分类号: H01L27/115
- IPC分类号: H01L27/115 ; G11C11/15 ; G11B5/39
摘要:
Magnetic tunnel junctions (MTJs) and methods of forming same are disclosed. A pinned layer is disposed in the MTJ such that a free layer of the MTJ can couple to a drain of an access transistor when provided in a magnetic random access memory (MRAM) bitcell. This structure alters the write current flow direction to align the write current characteristics of the MTJ with write current supply capability of an MRAM bitcell employing the MTJ. As a result, more write current can be provided to switch the MTJ from a parallel (P) to anti-parallel (AP) state. An anti-ferromagnetic material (AFM) layer is provided on the pinned layer to fix pinned layer magnetization. To provide enough area for depositing the AFM layer to secure pinned layer magnetization, a pinned layer having a pinned layer surface area greater than a free layer surface area of the free layer is provided.
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